Conference on Computer Vision and Pattern Recognition New York City, New York, 17-22 June, 2006 / IEEE Computer Society, IEEE ; edited by Cordelia Schmid, Stefano Soatto, Carlo Tomasi.

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Bibliographic Details
Corporate Authors: IEEE Computer Society Conference on Computer Vision and Pattern Recognition New York, N.Y., IEEE Computer Society, Institute of Electrical and Electronics Engineers
Other Authors: Schmid, Cordelia, Soatto, Stefano, Tomasi, Carlo, 1956-
Format: eBook
Language:English
Published: Piscataway, N.J. : IEEE, c2006.
Subjects:
Computer vision > Congresses.
Pattern recognition systems > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=10922
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