26th IEEE VLSI Test Symposium proceedings : San Diego, California, 27 April - 1 May 2008 / [sponsored by] IEEE Computer Society.

Saved in:
Bibliographic Details
Corporate Authors: IEEE VLSI Test Symposium San Diego, Calif., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2008.
Subjects:
Integrated circuits > Very large scale integration > Testing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4511672
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items