Wavelet Analysis and Pattern Recognition, 2008, ICWAPR '08, International Conference on

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Bibliographic Details
Corporate Author: International Conference on Wavelet Analysis and Pattern Recognition Hong Kong, China
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE Xplore, c2008.
Subjects:
Wavelets (Mathematics) > Congresses.
Wavelengths > Data processing > Congresses.
Pattern perception > Congresses.
Imaging systems > Congresses.
Online Access:Restricted to IEEE Xplore subscribers
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