2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems proceedings, April 16-18, 2008, Bratislava, Slovaka / sponsored by IEEE Computer Society, Test Technology Technical Council ; in cooperation with Institute of Informatics of the Slovak Academy of Sciences ; [editors, Bernd Straube ... [et al.]].

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Bibliographic Details
Corporate Authors: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Bratislava, Slovakia, IEEE Computer Society. Technical Council on Test Technology, Slovenska akademia vied. Institute of Informatics, IEEE Xplore (Online service)
Other Authors: Straube, Bernd
Format: eBook
Language:English
Published: [Piscataway, N.J.] : Institute of Electrical and Electronic Engineers, c2008.
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Online Access:Access restricted to subscribers
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