IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Bratislava, Slovakia, IEEE Computer Society. Technical Council on Test Technology, Slovenska akademia vied. Institute of Informatics, IEEE Xplore (Online service), & Straube, B. (2008). 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems proceedings, April 16-18, 2008, Bratislava, Slovaka / sponsored by IEEE Computer Society, Test Technology Technical Council ; in cooperation with Institute of Informatics of the Slovak Academy of Sciences ; [editors, Bernd Straube ... [et al.]]: Proceedings, April 16-18, 2008, Bratislava, Slovaka. Institute of Electrical and Electronic Engineers.
Chicago Style (17th ed.) CitationIEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Bratislava, Slovakia, IEEE Computer Society. Technical Council on Test Technology, Slovenska akademia vied. Institute of Informatics, IEEE Xplore (Online service), and Bernd Straube. 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Proceedings, April 16-18, 2008, Bratislava, Slovaka / Sponsored by IEEE Computer Society, Test Technology Technical Council ; in Cooperation with Institute of Informatics of the Slovak Academy of Sciences ; [editors, Bernd Straube ... [et Al.]]: Proceedings, April 16-18, 2008, Bratislava, Slovaka. [Piscataway, N.J.]: Institute of Electrical and Electronic Engineers, 2008.
MLA (9th ed.) CitationIEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Bratislava, Slovakia, et al. 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Proceedings, April 16-18, 2008, Bratislava, Slovaka / Sponsored by IEEE Computer Society, Test Technology Technical Council ; in Cooperation with Institute of Informatics of the Slovak Academy of Sciences ; [editors, Bernd Straube ... [et Al.]]: Proceedings, April 16-18, 2008, Bratislava, Slovaka. Institute of Electrical and Electronic Engineers, 2008.