The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems proceedings, Boston, Massachusetts, 1-3 October 2008 / sponsored by the IEEE Computer Society Test Technology Technical Committee Council, the IEEE Computer Society Technical Committee on Fault Tolerant Computing ; edited by Cristiana Bolchini ... [et al.].

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Bibliographic Details
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Boston, Mass., IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Fault-Tolerant Computing Technical Committee, IEEE Computer Society
Other Authors: Bolchini, Cristiana
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, c2008.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Fault-tolerant computing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4641141
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