Library Catalogue Plus

APA (7th ed.) Citation

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Boston, Mass, IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Fault-Tolerant Computing Technical Committee, IEEE Computer Society, & Bolchini, C. (2008). The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems proceedings, Boston, Massachusetts, 1-3 October 2008 / sponsored by the IEEE Computer Society Test Technology Technical Committee Council, the IEEE Computer Society Technical Committee on Fault Tolerant Computing ; edited by Cristiana Bolchini ... [et al.]: Proceedings, Boston, Massachusetts, 1-3 October 2008. IEEE Computer Society Press.

Chicago Style (17th ed.) Citation

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Boston, Mass, IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Fault-Tolerant Computing Technical Committee, IEEE Computer Society, and Cristiana Bolchini. The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems Proceedings, Boston, Massachusetts, 1-3 October 2008 / Sponsored by the IEEE Computer Society Test Technology Technical Committee Council, the IEEE Computer Society Technical Committee on Fault Tolerant Computing ; Edited by Cristiana Bolchini ... [et Al.]: Proceedings, Boston, Massachusetts, 1-3 October 2008. Los Alamitos, Calif.: IEEE Computer Society Press, 2008.

MLA (9th ed.) Citation

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Boston, Mass, et al. The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems Proceedings, Boston, Massachusetts, 1-3 October 2008 / Sponsored by the IEEE Computer Society Test Technology Technical Committee Council, the IEEE Computer Society Technical Committee on Fault Tolerant Computing ; Edited by Cristiana Bolchini ... [et Al.]: Proceedings, Boston, Massachusetts, 1-3 October 2008. IEEE Computer Society Press, 2008.