Proceedings of the 17th Asian Test Symposium November 24-27, 2008 Sapporo, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC) ... [et al.].
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| Corporate Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Los Alamitos, Calif. :
IEEE Computer Society,
c2008.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4711536 |
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