2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis ICTD '09, Chengdu, China, April 28-29, 2009 / edited by Bing Long and Wenjiang Li.
Testing and Fault Diagnosis for Digital, Analog and Mixed Circuits and Systems.
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
[Piscataway, N.J.] :
IEEE,
c2009.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4960731 |
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