IEEE Circuits and Systems International Conference on Testing and Diagnosis Chengdu, China, Long, B., & Li, W. (2009). 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis ICTD '09, Chengdu, China, April 28-29, 2009 / edited by Bing Long and Wenjiang Li: ICTD '09, Chengdu, China, April 28-29, 2009. IEEE.
Chicago Style (17th ed.) CitationIEEE Circuits and Systems International Conference on Testing and Diagnosis Chengdu, China, Bing Long, and Wenjiang Li. 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis ICTD '09, Chengdu, China, April 28-29, 2009 / Edited by Bing Long and Wenjiang Li: ICTD '09, Chengdu, China, April 28-29, 2009. [Piscataway, N.J.]: IEEE, 2009.
MLA (9th ed.) CitationIEEE Circuits and Systems International Conference on Testing and Diagnosis Chengdu, China, et al. 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis ICTD '09, Chengdu, China, April 28-29, 2009 / Edited by Bing Long and Wenjiang Li: ICTD '09, Chengdu, China, April 28-29, 2009. IEEE, 2009.