VLSI Design, Automation and Test, 2009, VLSI-DAT '09, International Symposium on

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Bibliographic Details
Corporate Authors: International Symposium on VLSI Design, Automation, and Test Hsin-chu shih, Taiwan, Gong ye ji shu yan jiu yuan, Institute of Electrical and Electronics Engineers
Format: eBook
Language:English
Published: Hsinchu, Taiwan : Piscataway, N.J. : ITRI ; IEEE, c2009.
Subjects:
Integrated circuits > Very large scale integration > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=5128899
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