2009 27th IEEE VLSI Test Symposium proceedings : 37 May 2009 Santa Cruz, CA, USA ; VTS 2009 / [sponsored by] IEEE Computer Society.

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Bibliographic Details
Corporate Authors: IEEE VLSI Test Symposium Santa Cruz, Calif., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2009.
Subjects:
Integrated circuits > Very large scale integration > Testing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=5116585
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