Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... [et al.].
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| Format: | eBook |
| Language: | English |
| Published: |
Piscataway, NJ : Hoboken, NJ :
IEEE Press ; Wiley,
c2009.
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| Series: | IEEE Press series on microelectronic systems.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029 |
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