APA (7th ed.) Citation

Strong, A. W. (2009). Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... [et al.]. IEEE Press ; Wiley.

Chicago Style (17th ed.) Citation

Strong, Alvin Wayne. Reliability Wearout Mechanisms in Advanced CMOS Technologies Alvin W. Strong ... [et Al.]. Piscataway, NJ : Hoboken, NJ: IEEE Press ; Wiley, 2009.

MLA (9th ed.) Citation

Strong, Alvin Wayne. Reliability Wearout Mechanisms in Advanced CMOS Technologies Alvin W. Strong ... [et Al.]. IEEE Press ; Wiley, 2009.

Warning: These citations may not always be 100% accurate.