Surface metrology : measurement, metrology, primary form, waviness, roughness, profilometer, stylus / Lambert M. Surhone, Miriam T. Timpledon, Susan F. Marseken (ed.).

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Bibliographic Details
Other Authors: Surhone, Lambert M., Timpledon, Miriam T., Marseken, Susan F.
Format: Book
Language:English
Published: Beau Bassin : Betascript, 2010.
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