Library Catalogue Plus

APA (7th ed.) Citation

Surhone, L. M., Timpledon, M. T., & Marseken, S. F. (2010). Surface metrology : measurement, metrology, primary form, waviness, roughness, profilometer, stylus / Lambert M. Surhone, Miriam T. Timpledon, Susan F. Marseken (ed.): Measurement, metrology, primary form, waviness, roughness, profilometer, stylus. Betascript.

Chicago Style (17th ed.) Citation

Surhone, Lambert M., Miriam T. Timpledon, and Susan F. Marseken. Surface Metrology : Measurement, Metrology, Primary Form, Waviness, Roughness, Profilometer, Stylus / Lambert M. Surhone, Miriam T. Timpledon, Susan F. Marseken (ed.): Measurement, Metrology, Primary Form, Waviness, Roughness, Profilometer, Stylus. Beau Bassin: Betascript, 2010.

MLA (9th ed.) Citation

Surhone, Lambert M., et al. Surface Metrology : Measurement, Metrology, Primary Form, Waviness, Roughness, Profilometer, Stylus / Lambert M. Surhone, Miriam T. Timpledon, Susan F. Marseken (ed.): Measurement, Metrology, Primary Form, Waviness, Roughness, Profilometer, Stylus. Betascript, 2010.