Advanced scanning electron microscopy and x-ray microanalysis / Dale E. Newbury ... [et al.].

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Bibliographic Details
Other Authors: Newbury, Dale E.
Format: Book
Language:English
Published: New York ; London : Plenum, c1986.
Subjects:
Scanning electron microscopy.
X-ray microanalysis.
Electron Probe Microanalysis.
Microscopy, Electron, Scanning.
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Pilkington Library

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Shelfmark: 502.825/ADV
Copy number Shelving location Availability
Copy [0404032192] Unknown Charged Due: 19-03-2025

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