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Ellipsometry at the nanoscale...
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Ellipsometry at the nanoscale / edited by Maria Losurdo, Kurt Hingerl.
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Bibliographic Details
Other Authors:
Losurdo, Maria
,
Hingerl, Kurt
Format:
Book
Language:
English
Published:
Berlin ; London :
Springer,
2013.
Subjects:
Ellipsometry
Nanostructured materials
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