Journey to data quality Yang W. Lee ... [et al.].

Saved in:
Bibliographic Details
Other Authors: Lee, Yang W.
Format: eBook
Language:English
Published: Cambridge, Mass. : MIT Press, c2006.
Subjects:
Online Access:http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267297
Tags: Add Tag
No Tags, Be the first to tag this record!