Helium ion microscopy : principles and applications / David C. Joy.
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
c2013.
|
| Series: | SpringerBriefs in materials.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|