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Helium ion microscopy : principles and applications / David C. Joy. principles and applications /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
c2013.
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| Series: | SpringerBriefs in materials.
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| Subjects: | |
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Pilkington Library
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Shelfmark:
578.1/JOY |
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Copy [0404259405]
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