Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

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Bibliographic Details
Main Authors: Servin, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moises (Jose Moises) (Author)
Format: Book
Language:English
Published: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, [2014]
Subjects:
Diffraction patterns > Data processing.
Image processing > Data processing.
Optical measurements.
Interferometry > Mathematical models.
Optical measurements > Mathematical models.
Diffraction patterns.
Metrology.
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