APA (7th ed.) Citation

Servin, M., Quiroga, J. A., & Padilla, J. M. (2014). Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla: Theory, algorithms, and applications. Wiley-VCH Verlag GmbH & Co. KGaA.

Chicago Style (17th ed.) Citation

Servin, Manuel, J. Antonio Quiroga, and J. Moises Padilla. Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla: Theory, Algorithms, and Applications. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2014.

MLA (9th ed.) Citation

Servin, Manuel, et al. Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla: Theory, Algorithms, and Applications. Wiley-VCH Verlag GmbH & Co. KGaA, 2014.

Warning: These citations may not always be 100% accurate.