Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].
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| Format: | eBook |
| Language: | English |
| Published: |
Piscataway, New Jersey :
IEEE Press,
c2009.
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| Series: | IEEE Press Series on Microelectronic Systems ;
12 |
| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029 |
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