APA (7th ed.) Citation

Strong, A. W. (2009). Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.]. IEEE Press.

Chicago Style (17th ed.) Citation

Strong, Alvin Wayne. Reliability Wearout Mechanisms in Advanced CMOS Technologies / Alvin W. Strong ... [et Al.]. Piscataway, New Jersey: IEEE Press, 2009.

MLA (9th ed.) Citation

Strong, Alvin Wayne. Reliability Wearout Mechanisms in Advanced CMOS Technologies / Alvin W. Strong ... [et Al.]. IEEE Press, 2009.

Warning: These citations may not always be 100% accurate.