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X-ray diffraction for materials research : from fundamentals to applications / Myeongkyu Lee, PhD. from fundamentals to applications /
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| Format: | Book |
| Language: | English |
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Oakville, ON, Canada ; Waretown, NJ, USA :
Apple Academic Press,
[2016]
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Pilkington Library
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Shelfmark:
620.11272/LEE |
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Copy [0404729231]
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