X-ray diffraction for materials research : from fundamentals to applications / Myeongkyu Lee, PhD. from fundamentals to applications /

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Bibliographic Details
Main Author: Lee, Myeongkyu
Format: Book
Language:English
Published: Oakville, ON, Canada ; Waretown, NJ, USA : Apple Academic Press, [2016]
Subjects:
X-rays > Diffraction.
Materials > Research.
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Description
Physical Description:xii, 289 pages : illustrations ; 24 cm
Bibliography:Includes bibliographical references and index.
ISBN:9781771882989
1771882980

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