Accelerated testing : statistical models, test plans, and data analyses / Wayne Nelson
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Hoboken, N.J. :
John Wiley & Sons,
2004
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| Edition: | Slightly updated paperback version of the first ed.. |
| Series: | Wiley series in probability and statistics
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| Subjects: | |
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