Symposium on advances in electron metallography and electron probe microanalysis sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N. J., J
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| Corporate Authors: | , , |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
Philadelphia, Pa. :
American Society for Testing and Materials,
c1962.
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| Series: | Journal of ASTM International. Selected technical papers ;
STP 317. |
| Subjects: | |
| Online Access: | https://compass.astm.org/document/?contentCode=ASTM%7CSTP317-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true |
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