Statistical analysis of fatigue data a symposium sponsored by ASTM Committee E-9 on Fatigue, American Society for Testing and Materials, Pittsburgh, Pa., 30-31 Oct. 1979, R. E. Little, University of Michigan at Dearborn, and J. C. Ekvall, Lockheed-California Company, editors.

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Bibliographic Details
Corporate Authors: Symposium on Statistical Analysis of Fatigue Data Pittsburgh, Pa, American Society for Testing and Materials, ASTM Committee E-9 on Fatigue
Other Authors: Little, R. E., (Robert Eugene), 1933- (ed.), Ekvall, J. C. (ed.)
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1981.
Series:Journal of ASTM International. STP 744.
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Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP744-EB%7Cen-US
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