Fatigue crack growth under spectrum loads a symposium presented at the seventy-eighth annual meeting, American Society for Testing and Materials, Montreal, Canada, 23-24 June 1975, R. P. Wei and R. I. Stephens symposium cochairmen.
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| Corporate Authors: | , , , |
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Philadelphia, Pa. :
American Society for Testing and Materials,
c1976.
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| Series: | Journal of ASTM International.
STP 595. |
| Subjects: | |
| Online Access: | https://compass.astm.org/document/?contentCode=ASTM%7CSTP595-EB%7Cen-US |
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