Radiation effects in electronics presented at a joint meeting of astm committee e-10 on radioisotopes and radiation effects and the niagara-finger lakes section of the american nuclear society syracuse, n. y., oct. 5-7, 1964.

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Bibliographic Details
Corporate Authors: Joint ANS-ASTM Conference on Radiation Effects in Electronics Syracuse, N.Y., American Society for Testing and Materials, American Society for Testing and Materials. Meeting, ASTM Committee E-10 on Radioisotopes and Radiation Effects, American Nuclear Society. Niagara Finger Lakes Section
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1965.
Series:Journal of ASTM International. Selected technical papers ; STP 384.
Subjects:
Semiconductors > Effect of radiation on > Congresses.
Electronic apparatus and appliances > Effect of radiation on > Congresses.
Thermoluminescence > Congresses.
Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP384-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true
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