Applications of electron microfractography to materials research a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970.

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Bibliographic Details
Corporate Authors: Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., American Society for Testing and Materials, American Society for Testing and Materials. Meeting, American Society for Testing and Materials. Committee E-24 on Fracture Testing of Metals
Other Authors: Wiebe, W.
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1971.
Series:Journal of ASTM International. STP 493.
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Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP493-EB%7Cen-US
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