APA (7th ed.) Citation

Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., American Society for Testing and Materials, American Society for Testing and Materials. Meeting, American Society for Testing and Materials. Committee E-24 on Fracture Testing of Metals, & Wiebe, W. (1971). Applications of electron microfractography to materials research a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970: A symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970. American Society for Testing and Materials.

Chicago Style (17th ed.) Citation

Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., American Society for Testing and Materials, American Society for Testing and Materials. Meeting, American Society for Testing and Materials. Committee E-24 on Fracture Testing of Metals, and W. Wiebe. Applications of Electron Microfractography to Materials Research a Symposium Presented at the Seventy-third Annual Meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970: A Symposium Presented at the Seventy-third Annual Meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970. Philadelphia, Pa.: American Society for Testing and Materials, 1971.

MLA (9th ed.) Citation

Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., et al. Applications of Electron Microfractography to Materials Research a Symposium Presented at the Seventy-third Annual Meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970: A Symposium Presented at the Seventy-third Annual Meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970. American Society for Testing and Materials, 1971.

Warning: These citations may not always be 100% accurate.