Semiconductor measurement technology spreading resistance symposium : proceedings of a symposium held at the National Bureau of Standards, Gaithersburg, Maryland, June 13-14, 1974 / James R. Ehrstein, editor, Electronic Technology Division, Institute for Applied Technology, National Bureau of Standards, Washington, D.C., 20234.
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| Corporate Authors: | , , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Boulder, Colo. : Washington, D.C. :
U.S. Dept. of Commerce, National Bureau of Standards ; For sale by the Supt. of Docs., U.S. G.P.O.,
1974.
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| Series: | Journal of ASTM International.
STP 572. NBS special publication ; 400-10. |
| Subjects: | |
| Online Access: | https://compass.astm.org/document/?contentCode=ASTM%7CSTP572-EB%7Cen-US |
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