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Transmission electron microscopy : diffraction, imaging, and spectrometry / C. Barry Carter, David B. Williams (Eds.) ; foreword by Sir John Meuring Thomas. diffraction, imaging, and spectrometry /
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| Format: | Book |
| Language: | English |
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Berlin :
Springer,
[2018]
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Pilkington Library
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Shelfmark:
502.825/TRA |
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Copy [0404809758]
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