Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements

Surface profile and topography measurements of manufactured goods and components across all sectors of engineering are an integral component of a production process. Control measurements are taken on a regular basis to ensure items fulfil the required quality standards. Recent industry developments...

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Bibliographic Details
Main Author: Tobias Reichold
Format: Default Thesis
Published: 2020
Subjects:
Mechanical engineering not elsewhere classified
hyperspectral
Interferometry
single-shot
imaging technique
Smooth surface
Profilometry
Areal
Rough Surface
speckle
roughness parameters
Depth-resolved
pinhole array
microlens arrays
4f imaging
SLED
calibration
Stepped Surface
Tilted Surface
spectrum
spectra
Mechanical Engineering not elsewhere classified
Online Access:https://dx.doi.org/10.26174/thesis.lboro.13259174.v1
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