Improving the segmentation of scanning probe microscope images using convolutional neural networks

A wide range of techniques can be considered for segmentation of images of nanostructured surfaces. Manually segmenting these images is time-consuming and results in a user-dependent segmentation bias, while there is currently no consensus on the best automated segmentation methods for particular te...

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Bibliographic Details
Main Authors: Steff Farley, Jo EA Hodgkinson, Oliver M Gordon, Joanna Turner, Andrea Soltoggio, Philip J Moriarty, Eugenie Hunsicker
Format: Default Article
Published: 2020
Subjects:
atomic force microscopy
dewetting
nanoparticle
machine learning
image segmentation
U-net
Online Access:https://hdl.handle.net/2134/14336597.v1
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