The impact of soft errors in memory units of edge devices executing convolutional neural networks

Driven by the success of machine learning algorithms for recognizing and identifying objects, there are significant efforts to exploit convolutional neural networks (CNNs) in edge devices. The growing adoption of CNNs in safety-critical embedded systems (e.g., autonomous vehicles) increases the dema...

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Bibliographic Details

Main Authors:	Geancarlo Abich, Rafael Garibotti, Ricardo Reis, Luciano Ost
Format:	Default Article
Published:	2022
Subjects:	Engineering Random access memory Data models Convolutional neural networks Reliability Registers Circuit faults Analytical models Soft error Memory reliability CNNs
Online Access:	https://hdl.handle.net/2134/23552847.v1
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