Investigating electrical properties of highly resistive ZnO films using a parallel dipole line hall effect system

Electrical properties of as-deposited, annealed, and CdCh treated ZnO films were investigated using an ultra-sensitive PDL Hall effect system. Carrier concentration, mobility, and conductivity of the films were extracted from Hall effect measurements. Previous thinner ZnO films deposited by RF sputt...

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Bibliographic Details
Main Authors: Mustafa Togay, Luksa Kujovic, Rob Ellis, Martin Bliss, Kieran Curson, Gabor Parada, Eric Don, Kurt Barth, Michael Walls, Jake Bowers
Format: Default Conference proceeding
Published: 2024
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Online Access:https://hdl.handle.net/2134/27862176.v1
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