Investigating electrical properties of highly resistive ZnO films using a parallel dipole line hall effect system
Electrical properties of as-deposited, annealed, and CdCh treated ZnO films were investigated using an ultra-sensitive PDL Hall effect system. Carrier concentration, mobility, and conductivity of the films were extracted from Hall effect measurements. Previous thinner ZnO films deposited by RF sputt...
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| Main Authors: | , , , , , , , , , |
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| Format: | Default Conference proceeding |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/27862176.v1 |
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