Seeing the middle: reconstructing 3D internal electrode microstructures from low‐resolution surfaces with generative diffusion artificial intelligence

Characterizing the 3D complex energy materials interface is critical to understand the correlative relationship between performance, degradation, and structures. Unfortunately, the resolution of microscopy and image acquisition speed are limited by the nature of the hardware, causing high-throughput...

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Bibliographic Details

Main Authors:	Zhiqiang Niu, Zhaoxia Zhou, Patrice Perrenot, Claire Villevieille, Wanhui Zhao, Qiong Cai, Valerie Pinfield, Yun Wang
Format:	Default Article
Published:	2025
Subjects:	Nanotechnology REMind Energy Materials Interface High-throughput Characterization Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM)
Online Access:	https://hdl.handle.net/2134/30408166.v1
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