Mapping the surface electronic landscape of solution-processed CuIn(S,Se)2 thin-films as a function of the Cu/In ratio

This study explores the influence of the Cu/In ratio, ranging from 0.80 to 1.10, on the surface composition, electronic landscape, and photovoltaic (PV) performance of solution-processed CuIn(S,Se)2 (CISSe) thin films. X-ray fluorescence (XRF) confirmed that the Cu/In ratio in the CISSe films closel...

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Bibliographic Details
Main Authors: Ye Ma, Alice Sheppard, Jacques Kenyon, Jude Laverock, Nada Benhaddou, Valentina Corsetti, Jake Bowers, David J Fermin
Format: Default Article
Published: 2025
Subjects:
Solution-processing
Mapping
Solution-processed CuIn(S,Se)2
Thin-films
X-ray fluorescence
Online Access:https://hdl.handle.net/2134/30911213.v1
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