Quantifying localized deformation in Malan loess under shearing using X-ray micro-CT

Loess tends to exhibit localized deformation in narrower bands when the material is subjected to shear stress exceeding its strength. This deformation is often a precursor to larger-scale failure, as it can significantly reduce the bearing capacity of the material. Quantifying localized deformation...

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Bibliographic Details
Main Authors: Yanyan Zhou, Bo Yu, Wen Fan, Tom Dijkstra, Ya-ni Wei, Longsheng Deng
Format: Default Article
Published: 2025
Subjects:
Engineering
Loess
Shear failure
X-ray micro-computed tomography
Displacement field
Online Access:https://hdl.handle.net/2134/31410129.v1
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