Wang, S., Harvey, C., Yuan, B., Critchlow, G., & Thomson, R. (2018). Thin film properties by blister tests.
Chicago Style (17th ed.) CitationWang, Simon, Christopher Harvey, Bo Yuan, Gary Critchlow, and Rachel Thomson. Thin Film Properties by Blister Tests. 2018.
MLA (9th ed.) CitationWang, Simon, et al. Thin Film Properties by Blister Tests. 2018.
Warning: These citations may not always be 100% accurate.