Near-surface structure and residual stress in as-machined synthetic graphite

We have used optical and electron microscopy and Raman spectroscopy to study the structural changes and residual stress induced by typical industrial machining and laboratory polishing of a synthetic graphite. An abrasion layer of up to 35 nm in thickness formed on both machined and polished surface...

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Bibliographic Details

Main Authors:	Benjamin Maerz, Kenny Jolley, Roger Smith, Houzheng Wu
Format:	Default Article
Published:	2018
Subjects:	Other chemical sciences not elsewhere classified Mechanical engineering not elsewhere classified Graphite Plastic deformation Residual stress Graphene TEM Raman spectroscopy Chemical Sciences not elsewhere classified Mechanical Engineering
Online Access:	https://hdl.handle.net/2134/34789
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