An investigation into the effect of a post-electroplating electrochemical oxidation treatment on tin whisker formation

Since the ‘cracked oxide theory’ was proposed by Tu in 1994,1 there has only been a limited number of studies that have sought to investigate the effect of the Sn oxide on whisker growth. The current study has used electrochemical oxidation to produce oxide films, which has enabled the effect of the...

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Bibliographic Details
Main Authors: Mark Ashworth, Dan Haspel, Liang Wu, Geoffrey Wilcox, Roger J. Mortimer
Format: Default Article
Published: 2015
Subjects:
Materials engineering not elsewhere classified
Tin
Electrochemical oxidation
Electrodeposition
Whisker growth
Zinc
Diffusion
Materials Engineering not elsewhere classified
Online Access:https://hdl.handle.net/2134/16990
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