Sub-monolayer growth of Ag on flat and nanorippled SiO2 surfaces

In-situ Rutherford Backscattering Spectrometry (RBS) and Molecular Dynamics (MD) simulations have been used to investigate the growth dynamics of silver on a flat and the rippled silica surface. The calculated sticking coeficient of silver over a range of incidence angles shows a similar behaviour t...

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Bibliographic Details
Main Authors: Mukul Bhatnagar, Mukesh Ranjan, Kenny Jolley, Roger Smith, Subroto Mukherjee
Format: Default Article
Published: 2016
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Other mathematical sciences not elsewhere classified
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Mathematical Sciences not elsewhere classified
Online Access:https://hdl.handle.net/2134/21740
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