Comparative study of the structural and optical properties of epitaxial CuFeO2 and CuFe1 - xGaxO2 delafossite thin films grown by pulsed laser deposition methods

Three samples of epitaxial delafossite CuFeO2 and CuFe1 − xGaxO2 films were grown using Pulsed Laser Deposition techniques in high vacuum. The sample thicknesses were estimated to be 21 nm, 75 nm for the CuFeO2 films and ~ 37 nm for the composite sample containing gallium. The estimated gallium frac...

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Bibliographic Details

Main Authors:	R.A. Wheatley, S. Rojas, C. Oppolzer, Toyanath Joshi, Pavel Borisov, David Lederman, A.L. Cabrera
Format:	Default Article
Published:	2017
Subjects:	Other physical sciences not elsewhere classified Cu oxide Delafossite crystal structure Optical transmission Diffused reflectance Band gap p-Type semiconductor Photo-conductor Physical Sciences not elsewhere classified
Online Access:	https://hdl.handle.net/2134/25819
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