Magnetoelectric properties of 500-nm Cr2O3 films

The linear magnetoelectric effect was measured in 500-nm Cr2O3 films grown by radio frequency sputtering on Al2O3 substrates between top and bottom thin film Pt electrodes. Magnetoelectric susceptibility was measured directly by applying an alternating current (ac) electric field and measuring the i...

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Bibliographic Details
Main Authors: Pavel Borisov, T. Ashida, T. Nozaki, M. Sahashi, David Lederman
Format: Default Article
Published: 2016
Subjects:
Online Access:https://hdl.handle.net/2134/24571
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