Stacking faults in ultra-thin films of silver on Al(111) investigated by medium energy ion scattering
Medium energy ion scattering has been used to investigate depositions of 0.2, 1.4, 3.5 and 4.8 ML of silver onto Al(111). Energy profiles indicate alloying to the extent that aluminium is still visible after the deposition of 4.8 ML. From assessments of the visibility, blocking dips and fits using V...
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| Main Authors: | , , , , |
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| Format: | Default Article |
| Published: |
2010
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/8544 |
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