Stacking faults in ultra-thin films of silver on Al(111) investigated by medium energy ion scattering

Medium energy ion scattering has been used to investigate depositions of 0.2, 1.4, 3.5 and 4.8 ML of silver onto Al(111). Energy profiles indicate alloying to the extent that aluminium is still visible after the deposition of 4.8 ML. From assessments of the visibility, blocking dips and fits using V...

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Bibliographic Details
Main Authors: Christopher J. Howe, Michael Cropper, Richard M. Wardle, P. Bailey, T.C.Q. Noakes
Format: Default Article
Published: 2010
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Online Access:https://hdl.handle.net/2134/8544
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